2018 HSB 0015 (Q3334634)
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Project Q3334634 in Germany
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | 2018 HSB 0015 |
Project Q3334634 in Germany |
Statements
1,504,000.0 Euro
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1,880,000.0 Euro
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80.0 percent
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20 December 2017
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3 September 2019
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Bauhaus-Universität Weimar
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50°58'51.82"N, 11°19'16.82"E
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99423
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Analytisches, ultrahochauflösendes Rasterelektronenmikroskop mit fokussiertem Ionenstrahl (German)
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Analytical, ultra-high resolution scanning electron microscope with focused ion beam (English)
25 October 2021
0.0135120449005398
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Microscope électronique analytique à grille ultra-haute définition avec faisceau focalisé d’ion (French)
7 December 2021
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Analytische, ultrahoge resolutie aftasten elektronenmicroscoop met geconcentreerde ionenstraal (Dutch)
19 December 2021
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Microscopio elettronico a scansione ad altissima risoluzione con fascio di ioni focalizzato (Italian)
19 January 2022
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Microscopio de electrones de escaneo de ultra alta resolución con haz de iones enfocado (Spanish)
22 January 2022
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Analytisk scanningselektronmikroskop med ultrahøj opløsning med fokuseret ionstråle (Danish)
11 July 2022
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Αναλυτικό μικροσκόπιο ηλεκτρονίων σάρωσης υπερυψηλής ανάλυσης με εστιασμένη δέσμη ιόντων (Greek)
11 July 2022
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Analitički elektronski mikroskop za skeniranje ultravisoke razlučivosti s fokusiranim ionskim snopom (Croatian)
11 July 2022
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Microscop electronic analitic, ultra-înaltă rezoluție cu fascicul focalizat de ioni (Romanian)
11 July 2022
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Analytický elektrónový mikroskop s ultra vysokým rozlíšením so zaostreným iónovým lúčom (Slovak)
11 July 2022
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Mikroskopju tal-elettroni analitiku, b’riżoluzzjoni ultra-għolja b’raġġ ta’ joni ffukat (Maltese)
11 July 2022
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Microscópio eletrônico de varredura de ultra-alta resolução analítico com feixe de íons focado (Portuguese)
11 July 2022
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Analyyttinen, erittäin korkean resoluution skannauselektronimikroskooppi, jossa on keskittynyt ionisäde (Finnish)
11 July 2022
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Analityczny, ultra-wysoka rozdzielczość skanowania mikroskop elektronowy z skupioną wiązką jonów (Polish)
11 July 2022
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Analitični elektronski mikroskop z ultra visoko ločljivostjo s fokusiranim ionskim žarkom (Slovenian)
11 July 2022
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Analytický elektronový mikroskop s velmi vysokým rozlišením se zaostřeným iontovým paprskem (Czech)
11 July 2022
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Analizinis, itin didelės skiriamosios gebos skenavimo elektronų mikroskopas su fokusuotu jonų pluoštu (Lithuanian)
11 July 2022
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Analītisks, īpaši augstas izšķirtspējas skenēšanas elektronu mikroskops ar fokusētu jonu staru (Latvian)
11 July 2022
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Аналитичен, свръхвисока разделителна способност сканиращ електронен микроскоп с фокусиран йонен лъч (Bulgarian)
11 July 2022
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Analitikai, ultra-nagyfelbontású szkennelő elektronmikroszkóp fókuszált ionsugárral (Hungarian)
11 July 2022
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Micreascóp leictreon scanacháin anailíseach, ultra-ardtaifigh le léas iandírithe (Irish)
11 July 2022
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Analytiskt, ultraupplösande skanningselektronmikroskop med fokuserad jonstråle (Swedish)
11 July 2022
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Analüütiline ülikõrge resolutsiooniga skaneeriv elektronmikroskoop koos fokuseeritud ioonikiirega (Estonian)
11 July 2022
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16 February 2024
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Identifiers
DE_TEMPORARY_37279
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