High-precision techniques of millimeter and sub-THz band characterisation of materials for Microelectronics (Q84175)
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Project Q84175 in Poland
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | High-precision techniques of millimeter and sub-THz band characterisation of materials for Microelectronics |
Project Q84175 in Poland |
Statements
1,753,670.0 zloty
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1,753,670.0 zloty
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100.0 percent
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1 November 2016
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30 April 2020
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POLITECHNIKA WARSZAWSKA
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The main objective of this project will be to develop novel sensors and sensing methodologies useful to non-destructive contactless electric and magnetic characterization of materials at millimeter and sub-THz spectra. The implementation of this goal will be two-pronged. On one hand, the said resonant structures will be exploited to benefit from their inherent narrow-band properties, which are particularly useful at measuring low-loss materials. On the other hand, the research will also concern broadband measurement techniques based on multimode resonant structures. The auxiliary goal is adopting the technological approaches typical for the microelectronics industry and apply them for precise fabrication of novel resonant cavities operating in the millimeter and the sub-THz bands. Another such goal is development of a new low-loss yet high dielectric constant material for dielectric posts inserted into sensing cavities. (Polish)
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The main objective of this project will be to develop novel sensors and sensing methodologies useful to non-destructive contactless electric and magnetic characterisation of materials at millimeter and sub-THz spectra. The implementation of this goal will be two-Pronged. On one hand, the said Resonant structures will be exploited to benefit from their inherent narrow-band properties, which are particularly useful at measuring low-loss materials. On the other hand, the research will also concern broadband measurement techniques based on multimode Resonant structures. The auxiliary goal is adopting the technological approaches typical for the Microelectronics industry and apply them for precise fabrication of novel Resonant cavities operating in the millimeter and the sub-THz bands. Another such goal is development of a new low-loss yet high dielectric constant material for dielectric posts inserted into sensing cavities. (English)
14 October 2020
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L’objectif principal de ce projet sera de développer de nouveaux capteurs et méthodologies de détection utiles à la caractérisation électrique et magnétique non destructive sans contact des matériaux aux spectres millimètres et sub-THz. La réalisation de cet objectif sera à deux volets. D’une part, ces structures résonnantes seront exploitées pour bénéficier de leurs propriétés intrinsèques à bande étroite, qui sont particulièrement utiles pour mesurer les matériaux à faible perte. D’autre part, la recherche portera également sur les techniques de mesure à large bande basées sur des structures multimodes résonnantes. L’objectif auxiliaire est d’adopter les approches technologiques typiques de l’industrie de la microélectronique et de les appliquer pour la fabrication précise de cavités résonnantes nouvelles opérant dans les bandes millimètres et sub-THz. Un autre objectif de ce type est le développement d’un nouveau matériau constant diélectrique à faible perte mais élevé pour les poteaux diélectriques insérés dans les cavités sensibles. (French)
30 November 2021
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Identifiers
POIR.04.04.00-00-1C4B/16
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