Replacement and Update of the Quanta 200 Sweep Microscope of the Electronic Microscopy Division of the University of Cadiz (Q3150620)

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Project Q3150620 in Spain
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English
Replacement and Update of the Quanta 200 Sweep Microscope of the Electronic Microscopy Division of the University of Cadiz
Project Q3150620 in Spain

    Statements

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    660,400.0 Euro
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    825,500.0 Euro
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    80.0 percent
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    1 January 2018
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    31 December 2020
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    UNIVERSIDAD DE CADIZ
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    11028
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    Se solicita la sustitución del microscopio de barrido Quanta 200 de la División de Microscopía Electrónica de los SC-ICYT UCA, por un equipo de tipo haz doble (Dual Beam), con cañón de electrones de emisión de campo y cañón de iones Ga+, que permita actualizar sus capacidades y completar el catálogo de servicios incorporando un aspecto esencial en cualquier instalación moderna de microscopía electrónica: la preparación de muestras electrón-transparentes mediante técnicas de Haces de Iones Focalizados. _x000D_ Con esta acción, crucial para la DME-UCA, se pretende: (1) Dar continuidad a los servicios que se vienen prestando en las técnicas de microscopía electrónica de barrido; (2) Incorporar nuevas técnicas, bien desarrolladas y con amplio espectro de aplicaciones, tales como la Difracción de Electrones Retrodispersados o la Tomografía en Barrido mediante la aproximación corte-visualización; (3) Ofrecer un servicio de preparación de muestras para microscopía de Transmisión (TEM), Barrido-Transmisión (STEM) de materiales y dispositivos que contribuya a potenciar las actuales capacidades de los microscopios de última generación de los que dispone la unidad; (4) Desarrollar un servicio de caracterización singular incorporando al equipo solicitado, otro optimizado en la UCA para estudios de Catodoluminiscencia en SEM._x000D_ El equipamiento solicitado contribuirá decisivamente a consolidar y potenciar las capacidades de servicio de la DME-UCA , a nivel nacional, como nodo de la ICTS ELECMI. (Spanish)
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    This proposal aims at replacing the FEI Quanta 200 Scanning Transmission Microscope at the Electron Microscopy Division of the University of Cádiz by a Dual Beam, or Cross Beam, station which allows upgrading the current capabilities of this Facility and, at the same time, incorporating new analytical tools. Among the later, the goal would be adding to the basic electron imaging and TEM/STEM lamella preparation capabilities of this type of equipment those of 3D structural and composition reconstruction by FIB tomography, EDS and EBSD. The proposed solution involves a station wit FEG electron gun and Ga+ ion source._x000D_ Apart from incorporating a technique which is present in most modern, top level, EM Facilities and contributing to enlarging the service portfolio, the major goals of this key proposal for DME-UCA are the following: 1) To guarantee an on-going, high quality, service to DME-UCA users requiring Scanning Electron Microscopy analysis; 2) Incorporating new techniques currently unavailable at DME-UCA, such as Electron Backscattered Diffraction or FIB tomography; 3) Opening a new service of electron-transparent STEM sample preparation of materials and devices by FIB; 4) Developing an unique characterization service by incorporating to the proposed Dual Beam other already developed by DME-UCA researchers for Cathodeluminescence experiments in an Scanning Microscope._x000D_ The new equipment would consolidate the position of DME-UCA at both national and international levels. (English)
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    Puerto Real
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    Identifiers

    EQC2018-004113-P
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