Terhertz structured beams for material inspector (Q84353)

From EU Knowledge Graph
Revision as of 12:37, 14 October 2020 by DG Regio (talk | contribs) (‎Removed claim: summary (P836): Our research responses, to the need of screening potential security.The project amies at beam fousing of terhertz radiation.According to classcal electronic for Gausian beams, the focus of the diemeter cannot be lard that C. A the concrete.The effect is enough for long grounds for long terhertz vvelengths and hinders its handling resolution.The recent Experics in the salted structured light Show that the limit is less Conmissed.The project dus...)
Jump to navigation Jump to search
Project in Poland financed by DG Regio
Language Label Description Also known as
English
Terhertz structured beams for material inspector
Project in Poland financed by DG Regio

    Statements

    0 references
    784,970.0 zloty
    0 references
    188,392.8 Euro
    13 January 2020
    0 references
    784,970.0 zloty
    0 references
    188,392.8 Euro
    13 January 2020
    0 references
    100.0 percent
    0 references
    1 February 2019
    0 references
    31 January 2021
    0 references
    POLITECHNIKA WARSZAWSKA
    0 references
    Our research responds, to the need of screening potential security threats concealed by airline passengers, or in parcels for embassies, the topic nowadays essential. The project aims at beam focusing of terahertz radiation. According to classical electromagnetics for Gaussian beams, the focus spot diameter cannot be smaller than c.a the beam wavelength (due to the diffraction limit). The effect is notably for long terahertz wavelengths and hinders its imaging resolution. The recent experiments in the so-called structured light show that the limit is less constrained. The project coalesces two very vibrant fields in photonics: so-called structured light and terahertz techniques. It is predominantly experimental research, pioneering in THz vortices generation and their characterization. The outcome of the project will improve detail resolution in terahertz security scanners and material diagnostics, i.e., terahertz near-field microscopy for semiconductor and material science. (Polish)
    0 references

    Identifiers

    POIR.04.04.00-00-5E4E/18
    0 references