Q3180412 (Q3180412): Difference between revisions
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(Created claim: summary (P836): The central objective of this request is to expand the analytical possibilities of the FEI TITAN3 Themis 60-300 Microscope recently incorporated into the Electronic Microscopy Division of the SC-ICYT of the University of Cadiz through the acquisition of advanced electronic microscopy sample holders, as well as the possibility of reducing the working voltage to 60 kV, thus extending the use of this microscope to materials sensitive to irradiation...) |
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The central objective of this request is to expand the analytical possibilities of the FEI TITAN3 Themis 60-300 Microscope recently incorporated into the Electronic Microscopy Division of the SC-ICYT of the University of Cadiz through the acquisition of advanced electronic microscopy sample holders, as well as the possibility of reducing the working voltage to 60 kV, thus extending the use of this microscope to materials sensitive to irradiation damage, under conditions other than those usual in conventional microscopes. It is proposed, first of all, the acquisition of a double tilt vacuum transfer sample holder, which would allow the analytical study of the samples studied under quasi-situ conditions, after treatment in controlled atmosphere. It is also proposed to acquire a commercial sample holder that, thanks to its design and its large turning interval, allows the acquisition of X-EDS tomographic series to generate compositional maps in three dimensions. Finally, the 60 kV alignment of the FEI TITAN3 Themis 60-300 microscope is proposed. This addition extends the possibilities of using the FEI TITAN3 Themis 60-300 microscope to other materials, of technological importance, creating a new line of research at our University. (English) | |||||||||||||||
| Property / summary: The central objective of this request is to expand the analytical possibilities of the FEI TITAN3 Themis 60-300 Microscope recently incorporated into the Electronic Microscopy Division of the SC-ICYT of the University of Cadiz through the acquisition of advanced electronic microscopy sample holders, as well as the possibility of reducing the working voltage to 60 kV, thus extending the use of this microscope to materials sensitive to irradiation damage, under conditions other than those usual in conventional microscopes. It is proposed, first of all, the acquisition of a double tilt vacuum transfer sample holder, which would allow the analytical study of the samples studied under quasi-situ conditions, after treatment in controlled atmosphere. It is also proposed to acquire a commercial sample holder that, thanks to its design and its large turning interval, allows the acquisition of X-EDS tomographic series to generate compositional maps in three dimensions. Finally, the 60 kV alignment of the FEI TITAN3 Themis 60-300 microscope is proposed. This addition extends the possibilities of using the FEI TITAN3 Themis 60-300 microscope to other materials, of technological importance, creating a new line of research at our University. (English) / rank | |||||||||||||||
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| Property / summary: The central objective of this request is to expand the analytical possibilities of the FEI TITAN3 Themis 60-300 Microscope recently incorporated into the Electronic Microscopy Division of the SC-ICYT of the University of Cadiz through the acquisition of advanced electronic microscopy sample holders, as well as the possibility of reducing the working voltage to 60 kV, thus extending the use of this microscope to materials sensitive to irradiation damage, under conditions other than those usual in conventional microscopes. It is proposed, first of all, the acquisition of a double tilt vacuum transfer sample holder, which would allow the analytical study of the samples studied under quasi-situ conditions, after treatment in controlled atmosphere. It is also proposed to acquire a commercial sample holder that, thanks to its design and its large turning interval, allows the acquisition of X-EDS tomographic series to generate compositional maps in three dimensions. Finally, the 60 kV alignment of the FEI TITAN3 Themis 60-300 microscope is proposed. This addition extends the possibilities of using the FEI TITAN3 Themis 60-300 microscope to other materials, of technological importance, creating a new line of research at our University. (English) / qualifier | |||||||||||||||
point in time: 12 October 2021
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Revision as of 19:18, 12 October 2021
Project Q3180412 in Spain
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | No label defined |
Project Q3180412 in Spain |
Statements
16,763,213.6 Euro
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20,954,017.0 Euro
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80.0 percent
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1 January 2016
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31 December 2018
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UNIVERSIDAD DE CADIZ
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36°31'43.28"N, 6°11'24.79"W
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11028
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El objetivo central de esta solicitud es expandir las posibilidades analíticas del Microscopio FEI TITAN3 Themis 60-300 recientemente incorporado a la División de Microscopía Electrónica de los SC-ICYT de la Universidad de Cádiz mediante la adquisición de porta-muestras avanzados de microscopía electrónica, así como mediante la posibilidad de reducir el voltaje de trabajo a 60kV, extendiendo así el uso de este microscopio a materiales sensibles a daños por irradiación, en condiciones distintas a las habituales en microscopios convencionales. Se propone, en primer lugar, la adquisición de un portamuestras de doble inclinación de transferencia en vacío, que permitiría el estudio analítico de las muestras estudiadas en condiciones cuasi in-situ, tras un tratamiento en atmósfera controlada. Se propone igualmente la adquisición de un porta-muestras comercial que permita, gracias a su diseño y su gran intervalo de giro, la adquisición de series tomográficas en modo X-EDS para generar mapas composicionales en tres dimensiones. Finalmente se propone la incorporación del alineamiento a 60 kV del microscopio FEI TITAN3 Themis 60-300. A través de esta incorporación se amplía las posibilidades de uso del microscopio FEI TITAN3 Themis 60-300 a otros materiales, de importancia tecnológica, creándose una línea nueva de investigación en nuestra Universidad. (Spanish)
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The central objective of this request is to expand the analytical possibilities of the FEI TITAN3 Themis 60-300 Microscope recently incorporated into the Electronic Microscopy Division of the SC-ICYT of the University of Cadiz through the acquisition of advanced electronic microscopy sample holders, as well as the possibility of reducing the working voltage to 60 kV, thus extending the use of this microscope to materials sensitive to irradiation damage, under conditions other than those usual in conventional microscopes. It is proposed, first of all, the acquisition of a double tilt vacuum transfer sample holder, which would allow the analytical study of the samples studied under quasi-situ conditions, after treatment in controlled atmosphere. It is also proposed to acquire a commercial sample holder that, thanks to its design and its large turning interval, allows the acquisition of X-EDS tomographic series to generate compositional maps in three dimensions. Finally, the 60 kV alignment of the FEI TITAN3 Themis 60-300 microscope is proposed. This addition extends the possibilities of using the FEI TITAN3 Themis 60-300 microscope to other materials, of technological importance, creating a new line of research at our University. (English)
12 October 2021
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Puerto Real
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Identifiers
UNCA15-CE-3715
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