High-precision techniques of millimeter and sub-THz band characterisation of materials for Microelectronics (Q84175): Difference between revisions
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(Removed claim: financed by (P890): Directorate-General for Regional and Urban Policy (Q8361), Removing unnecessary financed by statement) |
(Changed label, description and/or aliases in fr: translated_label) |
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Techniques de haute précision de caractérisation de millimètre et de bande sub-THz des matériaux pour la microélectronique | |||
Revision as of 16:24, 30 November 2021
Project Q84175 in Poland
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | High-precision techniques of millimeter and sub-THz band characterisation of materials for Microelectronics |
Project Q84175 in Poland |
Statements
1,753,670.0 zloty
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1,753,670.0 zloty
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100.0 percent
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1 November 2016
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30 April 2020
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POLITECHNIKA WARSZAWSKA
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The main objective of this project will be to develop novel sensors and sensing methodologies useful to non-destructive contactless electric and magnetic characterization of materials at millimeter and sub-THz spectra. The implementation of this goal will be two-pronged. On one hand, the said resonant structures will be exploited to benefit from their inherent narrow-band properties, which are particularly useful at measuring low-loss materials. On the other hand, the research will also concern broadband measurement techniques based on multimode resonant structures. The auxiliary goal is adopting the technological approaches typical for the microelectronics industry and apply them for precise fabrication of novel resonant cavities operating in the millimeter and the sub-THz bands. Another such goal is development of a new low-loss yet high dielectric constant material for dielectric posts inserted into sensing cavities. (Polish)
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The main objective of this project will be to develop novel sensors and sensing methodologies useful to non-destructive contactless electric and magnetic characterisation of materials at millimeter and sub-THz spectra. The implementation of this goal will be two-Pronged. On one hand, the said Resonant structures will be exploited to benefit from their inherent narrow-band properties, which are particularly useful at measuring low-loss materials. On the other hand, the research will also concern broadband measurement techniques based on multimode Resonant structures. The auxiliary goal is adopting the technological approaches typical for the Microelectronics industry and apply them for precise fabrication of novel Resonant cavities operating in the millimeter and the sub-THz bands. Another such goal is development of a new low-loss yet high dielectric constant material for dielectric posts inserted into sensing cavities. (English)
14 October 2020
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Identifiers
POIR.04.04.00-00-1C4B/16
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