Innovative activities in the field of instrumentation of electron microscopy (Q11081): Difference between revisions

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(‎Removed claim: summary (P836): The aim of the project is to increase the innovation performance and competitiveness of Tecpa s.r.o. by enabling the production of a new type of detector of the restriated electrons with linear or curved microknobs able to make use of linear or curved microknobs in cartridges and for environmentally sound microscopechs.For the introduction of new detectors, the applicant needs to acquire a multi-functional machine tool for applications requiri...)
(‎Created claim: summary (P836): The aim of the project is to increase the innovative performance and competitiveness of Tecpa s.r.o. by enabling the production of a new type of detector of retro-reflected electrons with linear or curved sun tunnel usable in scanning and environmentally scanning microscopes.To introduce new detectors into production, the applicant needs to acquire a multifunctional machining centre for applications requiring high accuracy and other system works...)
Property / summary
 
The aim of the project is to increase the innovative performance and competitiveness of Tecpa s.r.o. by enabling the production of a new type of detector of retro-reflected electrons with linear or curved sun tunnel usable in scanning and environmentally scanning microscopes.To introduce new detectors into production, the applicant needs to acquire a multifunctional machining centre for applications requiring high accuracy and other system workshop equipment (particle furniture, dishwasher, crane etc.). (English)
Property / summary: The aim of the project is to increase the innovative performance and competitiveness of Tecpa s.r.o. by enabling the production of a new type of detector of retro-reflected electrons with linear or curved sun tunnel usable in scanning and environmentally scanning microscopes.To introduce new detectors into production, the applicant needs to acquire a multifunctional machining centre for applications requiring high accuracy and other system workshop equipment (particle furniture, dishwasher, crane etc.). (English) / rank
 
Normal rank
Property / summary: The aim of the project is to increase the innovative performance and competitiveness of Tecpa s.r.o. by enabling the production of a new type of detector of retro-reflected electrons with linear or curved sun tunnel usable in scanning and environmentally scanning microscopes.To introduce new detectors into production, the applicant needs to acquire a multifunctional machining centre for applications requiring high accuracy and other system workshop equipment (particle furniture, dishwasher, crane etc.). (English) / qualifier
 
point in time: 22 October 2020
Timestamp+2020-10-22T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0

Revision as of 15:31, 22 October 2020

Project in Czech Republic financed by DG Regio
Language Label Description Also known as
English
Innovative activities in the field of instrumentation of electron microscopy
Project in Czech Republic financed by DG Regio

    Statements

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    3,983,445.0 Czech koruna
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    159,337.80 Euro
    10 January 2020
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    8,852,100.0 Czech koruna
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    354,084.0 Euro
    10 January 2020
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    45 percent
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    1 October 2017
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    27 May 2019
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    31 May 2019
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    Tecpa s.r.o.
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    49°11'6.61"N, 16°38'15.36"E
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    61800
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    Cílem projektu je zvýšit inovační výkonost a konkurenceschopnost společnosti Tecpa s.r.o. prostřednictvím umožnění výroby nového typu detektoru zpětně odražených elektronů s lineárním nebo zakřiveným světlovodem využitelného v rastrovacích a environmentálně rastrovacích mikroskopech.Pro zavedení nových detektorů do výroby žadatel potřebuje pořídit multifunkční obráběcí centrum pro aplikace vyžadující vysokou přesnost a další systémové dílenské vybavení (dílenský nábytek, myčka, jeřáb aj.). a. (Czech)
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    The aim of the project is to increase the innovative performance and competitiveness of Tecpa s.r.o. by enabling the production of a new type of detector of retro-reflected electrons with linear or curved sun tunnel usable in scanning and environmentally scanning microscopes.To introduce new detectors into production, the applicant needs to acquire a multifunctional machining centre for applications requiring high accuracy and other system workshop equipment (particle furniture, dishwasher, crane etc.). (English)
    22 October 2020
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    Identifiers

    CZ.01.1.02/0.0/0.0/16_049/0010081
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