Wafer Tester and Prober (Q3061681): Difference between revisions

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(‎Changed label, description and/or aliases in en: translated_label)
(‎Added qualifier: readability score (P590521): 0.0055134425753088)
 
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label / de-atlabel / de-at
Wafer Tester und Prober
label / frlabel / fr
 
Testeur de wafer et échantillonneur
label / nllabel / nl
 
Wafer Tester en Prober
label / delabel / de
 
Wafer Tester und Prober
label / itlabel / it
 
Tester di wafer e Prober
label / eslabel / es
 
Probador de obleas y Prober
label / ellabel / el
 
Γκοφρέτα Tester και Prober
label / dalabel / da
 
Wafer Tester og Prober
label / filabel / fi
 
Kiekkojen testaaja ja prober
label / mtlabel / mt
 
Tester tal-Wafer u Prober
label / lvlabel / lv
 
Vafeļu testeris un Prober
label / sklabel / sk
 
Tester na doštičky a Prober
label / galabel / ga
 
Tástálaí wafer agus Prober
label / cslabel / cs
 
Oplatky Tester a Prober
label / ptlabel / pt
 
Testador de bolachas e Prober
label / etlabel / et
 
Vahvli tester ja Prober
label / hulabel / hu
 
Wafer Tester és Prober
label / bglabel / bg
 
Тестер за вафли и прът
label / ltlabel / lt
 
Plokštelių testeris ir Prober
label / hrlabel / hr
 
Ispitivač poluvodiča i Prober
label / svlabel / sv
 
Wafer Tester och Prober
label / rolabel / ro
 
Tester și Prober
label / sllabel / sl
 
Tester za rezine in Prober
label / pllabel / pl
 
Wafel Tester i Prober
description / endescription / en
Project in Austria 1390
Project Q3061681 in Austria
description / bgdescription / bg
 
Проект Q3061681 в Австрия
description / hrdescription / hr
 
Projekt Q3061681 u Austriji
description / hudescription / hu
 
Projekt Q3061681 Ausztriában
description / csdescription / cs
 
Projekt Q3061681 v Rakousku
description / dadescription / da
 
Projekt Q3061681 i Østrig
description / nldescription / nl
 
Project Q3061681 in Oostenrijk
description / etdescription / et
 
Projekt Q3061681 Austrias
description / fidescription / fi
 
Projekti Q3061681 Itävallassa
description / frdescription / fr
 
Projet Q3061681 en Autriche
description / dedescription / de
 
Projekt Q3061681 in Österreich
description / eldescription / el
 
Έργο Q3061681 στην Αυστρία
description / gadescription / ga
 
Tionscadal Q3061681 san Ostair
description / itdescription / it
 
Progetto Q3061681 in Austria
description / lvdescription / lv
 
Projekts Q3061681 Austrijā
description / ltdescription / lt
 
Projektas Q3061681 Austrijoje
description / mtdescription / mt
 
Proġett Q3061681 fl-Awstrija
description / pldescription / pl
 
Projekt Q3061681 w Austrii
description / ptdescription / pt
 
Projeto Q3061681 na Áustria
description / rodescription / ro
 
Proiectul Q3061681 în Austria
description / skdescription / sk
 
Projekt Q3061681 v Rakúsku
description / sldescription / sl
 
Projekt Q3061681 v Avstriji
description / esdescription / es
 
Proyecto Q3061681 en Austria
description / svdescription / sv
 
Projekt Q3061681 i Österrike
Property / instance of: Kohesio project / rankProperty / instance of: Kohesio project / rank
Normal rank
Deprecated rank
Property / summary
Anschaffung eines Waver Testers und Probers - Testgeräte für die Chipentwicklung (German)
 
Property / summary: Anschaffung eines Waver Testers und Probers - Testgeräte für die Chipentwicklung (German) / rank
Normal rank
 
Property / summary: Purchase of a Waver Tester and Prober – Test Devices for Chip Development (English) / qualifier
 
readability score: 0.0055134425753088
Amount0.0055134425753088
Unit1
Property / contained in Local Administrative Unit
 
Property / contained in Local Administrative Unit: Dornbirn / rank
 
Normal rank
Property / instance of
 
Property / instance of: Discontinued Kohesio Project / rank
 
Normal rank
Property / summary
 
Acquisition d’un testeur Waver et d’un échantillonneur — Équipement de test pour le développement de puces (French)
Property / summary: Acquisition d’un testeur Waver et d’un échantillonneur — Équipement de test pour le développement de puces (French) / rank
 
Normal rank
Property / summary: Acquisition d’un testeur Waver et d’un échantillonneur — Équipement de test pour le développement de puces (French) / qualifier
 
point in time: 27 November 2021
Timestamp+2021-11-27T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Overname van een Waver Tester en Prober — Testers voor Chip Development (Dutch)
Property / summary: Overname van een Waver Tester en Prober — Testers voor Chip Development (Dutch) / rank
 
Normal rank
Property / summary: Overname van een Waver Tester en Prober — Testers voor Chip Development (Dutch) / qualifier
 
point in time: 29 November 2021
Timestamp+2021-11-29T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Anschaffung eines Waver Testers und Probers - Testgeräte für die Chipentwicklung (German)
Property / summary: Anschaffung eines Waver Testers und Probers - Testgeräte für die Chipentwicklung (German) / rank
 
Normal rank
Property / summary
 
Acquisizione di un Waver Tester e Prober — Testers for Chip Development (Italian)
Property / summary: Acquisizione di un Waver Tester e Prober — Testers for Chip Development (Italian) / rank
 
Normal rank
Property / summary: Acquisizione di un Waver Tester e Prober — Testers for Chip Development (Italian) / qualifier
 
point in time: 11 January 2022
Timestamp+2022-01-11T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Adquisición de un probador Waver y Prober — Testers para el desarrollo de chips (Spanish)
Property / summary: Adquisición de un probador Waver y Prober — Testers para el desarrollo de chips (Spanish) / rank
 
Normal rank
Property / summary: Adquisición de un probador Waver y Prober — Testers para el desarrollo de chips (Spanish) / qualifier
 
point in time: 12 January 2022
Timestamp+2022-01-12T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Αγορά ενός Waver Tester και Prober — Συσκευές δοκιμής για την ανάπτυξη τσιπ (Greek)
Property / summary: Αγορά ενός Waver Tester και Prober — Συσκευές δοκιμής για την ανάπτυξη τσιπ (Greek) / rank
 
Normal rank
Property / summary: Αγορά ενός Waver Tester και Prober — Συσκευές δοκιμής για την ανάπτυξη τσιπ (Greek) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Køb af en Waver Tester og Prober — Testenheder til Chip Development (Danish)
Property / summary: Køb af en Waver Tester og Prober — Testenheder til Chip Development (Danish) / rank
 
Normal rank
Property / summary: Køb af en Waver Tester og Prober — Testenheder til Chip Development (Danish) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Waver Testerin ja Proberin hankinta – Testilaitteet sirun kehittämiseen (Finnish)
Property / summary: Waver Testerin ja Proberin hankinta – Testilaitteet sirun kehittämiseen (Finnish) / rank
 
Normal rank
Property / summary: Waver Testerin ja Proberin hankinta – Testilaitteet sirun kehittämiseen (Finnish) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Xiri ta ‘Waver Tester u Prober — Apparati tat-Test għall-Iżvilupp taċ-Ċippa (Maltese)
Property / summary: Xiri ta ‘Waver Tester u Prober — Apparati tat-Test għall-Iżvilupp taċ-Ċippa (Maltese) / rank
 
Normal rank
Property / summary: Xiri ta ‘Waver Tester u Prober — Apparati tat-Test għall-Iżvilupp taċ-Ċippa (Maltese) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Waver Tester un Prober iegāde — Testa ierīces mikroshēmu izstrādei (Latvian)
Property / summary: Waver Tester un Prober iegāde — Testa ierīces mikroshēmu izstrādei (Latvian) / rank
 
Normal rank
Property / summary: Waver Tester un Prober iegāde — Testa ierīces mikroshēmu izstrādei (Latvian) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Nákup Waver Tester a Prober – testovacie zariadenia pre vývoj čipov (Slovak)
Property / summary: Nákup Waver Tester a Prober – testovacie zariadenia pre vývoj čipov (Slovak) / rank
 
Normal rank
Property / summary: Nákup Waver Tester a Prober – testovacie zariadenia pre vývoj čipov (Slovak) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Ceannach Tester Waver agus Prober — Gléasanna Tástála d’Fhorbairt Chip (Irish)
Property / summary: Ceannach Tester Waver agus Prober — Gléasanna Tástála d’Fhorbairt Chip (Irish) / rank
 
Normal rank
Property / summary: Ceannach Tester Waver agus Prober — Gléasanna Tástála d’Fhorbairt Chip (Irish) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Nákup Waver Tester a Prober – testovací zařízení pro vývoj čipů (Czech)
Property / summary: Nákup Waver Tester a Prober – testovací zařízení pro vývoj čipů (Czech) / rank
 
Normal rank
Property / summary: Nákup Waver Tester a Prober – testovací zařízení pro vývoj čipů (Czech) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Compra de um testador Waver e Prober — Dispositivos de teste para o desenvolvimento de chips (Portuguese)
Property / summary: Compra de um testador Waver e Prober — Dispositivos de teste para o desenvolvimento de chips (Portuguese) / rank
 
Normal rank
Property / summary: Compra de um testador Waver e Prober — Dispositivos de teste para o desenvolvimento de chips (Portuguese) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Waver Tester ja Prober ostmine – katseseadmed kiibi arendamiseks (Estonian)
Property / summary: Waver Tester ja Prober ostmine – katseseadmed kiibi arendamiseks (Estonian) / rank
 
Normal rank
Property / summary: Waver Tester ja Prober ostmine – katseseadmed kiibi arendamiseks (Estonian) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Waver Tester és Prober vásárlása – Teszteszközök a chipfejlesztéshez (Hungarian)
Property / summary: Waver Tester és Prober vásárlása – Teszteszközök a chipfejlesztéshez (Hungarian) / rank
 
Normal rank
Property / summary: Waver Tester és Prober vásárlása – Teszteszközök a chipfejlesztéshez (Hungarian) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Закупуване на Waver Tester и Prober — Тестови устройства за развитие на чипове (Bulgarian)
Property / summary: Закупуване на Waver Tester и Prober — Тестови устройства за развитие на чипове (Bulgarian) / rank
 
Normal rank
Property / summary: Закупуване на Waver Tester и Prober — Тестови устройства за развитие на чипове (Bulgarian) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
„Waver Tester“ ir „Prober“ įsigijimas – lustų kūrimo bandymo prietaisai (Lithuanian)
Property / summary: „Waver Tester“ ir „Prober“ įsigijimas – lustų kūrimo bandymo prietaisai (Lithuanian) / rank
 
Normal rank
Property / summary: „Waver Tester“ ir „Prober“ įsigijimas – lustų kūrimo bandymo prietaisai (Lithuanian) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Kupnja Waver Tester i Prober – Testni uređaji za razvoj čipova (Croatian)
Property / summary: Kupnja Waver Tester i Prober – Testni uređaji za razvoj čipova (Croatian) / rank
 
Normal rank
Property / summary: Kupnja Waver Tester i Prober – Testni uređaji za razvoj čipova (Croatian) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Köp av en Waver Tester och Prober – Testenheter för Chip Development (Swedish)
Property / summary: Köp av en Waver Tester och Prober – Testenheter för Chip Development (Swedish) / rank
 
Normal rank
Property / summary: Köp av en Waver Tester och Prober – Testenheter för Chip Development (Swedish) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Achiziționarea unui tester Waver și Prober – dispozitive de testare pentru dezvoltarea cipurilor (Romanian)
Property / summary: Achiziționarea unui tester Waver și Prober – dispozitive de testare pentru dezvoltarea cipurilor (Romanian) / rank
 
Normal rank
Property / summary: Achiziționarea unui tester Waver și Prober – dispozitive de testare pentru dezvoltarea cipurilor (Romanian) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Nakup Waver Tester in Prober – Testne naprave za razvoj čipov (Slovenian)
Property / summary: Nakup Waver Tester in Prober – Testne naprave za razvoj čipov (Slovenian) / rank
 
Normal rank
Property / summary: Nakup Waver Tester in Prober – Testne naprave za razvoj čipov (Slovenian) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / summary
 
Zakup testera Waver i Prober – urządzenia testowe do rozwoju chipów (Polish)
Property / summary: Zakup testera Waver i Prober – urządzenia testowe do rozwoju chipów (Polish) / rank
 
Normal rank
Property / summary: Zakup testera Waver i Prober – urządzenia testowe do rozwoju chipów (Polish) / qualifier
 
point in time: 17 August 2022
Timestamp+2022-08-17T00:00:00Z
Timezone+00:00
CalendarGregorian
Precision1 day
Before0
After0
Property / location (string)
 
Dornbirn
Property / location (string): Dornbirn / rank
 
Normal rank
Property / coordinate location
 
47°24'49.07"N, 9°44'32.60"E
Latitude47.413631
Longitude9.7423875
Precision1.0E-5
Globehttp://www.wikidata.org/entity/Q2
Property / coordinate location: 47°24'49.07"N, 9°44'32.60"E / rank
 
Normal rank
Property / contained in NUTS
 
Property / contained in NUTS: Rheintal-Bodenseegebiet / rank
 
Normal rank
Property / beneficiary
 
Property / beneficiary: Q3063379 / rank
 
Normal rank
Property / fund
 
Property / fund: European Regional Development Fund / rank
 
Normal rank
Property / programme
 
Property / programme: Investments in Growth and Employment - AT - ERDF / rank
 
Normal rank

Latest revision as of 10:45, 7 March 2024

Project Q3061681 in Austria
Language Label Description Also known as
English
Wafer Tester and Prober
Project Q3061681 in Austria

    Statements

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    664,490.0 Euro
    0 references
    12 February 2020
    0 references
    31 January 2021
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    Photeon Technologies GmbH
    0 references
    0 references

    47°24'49.07"N, 9°44'32.60"E
    0 references
    80301
    0 references
    Purchase of a Waver Tester and Prober – Test Devices for Chip Development (English)
    20 July 2021
    0.0055134425753088
    0 references
    Acquisition d’un testeur Waver et d’un échantillonneur — Équipement de test pour le développement de puces (French)
    27 November 2021
    0 references
    Overname van een Waver Tester en Prober — Testers voor Chip Development (Dutch)
    29 November 2021
    0 references
    Anschaffung eines Waver Testers und Probers - Testgeräte für die Chipentwicklung (German)
    0 references
    Acquisizione di un Waver Tester e Prober — Testers for Chip Development (Italian)
    11 January 2022
    0 references
    Adquisición de un probador Waver y Prober — Testers para el desarrollo de chips (Spanish)
    12 January 2022
    0 references
    Αγορά ενός Waver Tester και Prober — Συσκευές δοκιμής για την ανάπτυξη τσιπ (Greek)
    17 August 2022
    0 references
    Køb af en Waver Tester og Prober — Testenheder til Chip Development (Danish)
    17 August 2022
    0 references
    Waver Testerin ja Proberin hankinta – Testilaitteet sirun kehittämiseen (Finnish)
    17 August 2022
    0 references
    Xiri ta ‘Waver Tester u Prober — Apparati tat-Test għall-Iżvilupp taċ-Ċippa (Maltese)
    17 August 2022
    0 references
    Waver Tester un Prober iegāde — Testa ierīces mikroshēmu izstrādei (Latvian)
    17 August 2022
    0 references
    Nákup Waver Tester a Prober – testovacie zariadenia pre vývoj čipov (Slovak)
    17 August 2022
    0 references
    Ceannach Tester Waver agus Prober — Gléasanna Tástála d’Fhorbairt Chip (Irish)
    17 August 2022
    0 references
    Nákup Waver Tester a Prober – testovací zařízení pro vývoj čipů (Czech)
    17 August 2022
    0 references
    Compra de um testador Waver e Prober — Dispositivos de teste para o desenvolvimento de chips (Portuguese)
    17 August 2022
    0 references
    Waver Tester ja Prober ostmine – katseseadmed kiibi arendamiseks (Estonian)
    17 August 2022
    0 references
    Waver Tester és Prober vásárlása – Teszteszközök a chipfejlesztéshez (Hungarian)
    17 August 2022
    0 references
    Закупуване на Waver Tester и Prober — Тестови устройства за развитие на чипове (Bulgarian)
    17 August 2022
    0 references
    „Waver Tester“ ir „Prober“ įsigijimas – lustų kūrimo bandymo prietaisai (Lithuanian)
    17 August 2022
    0 references
    Kupnja Waver Tester i Prober – Testni uređaji za razvoj čipova (Croatian)
    17 August 2022
    0 references
    Köp av en Waver Tester och Prober – Testenheter för Chip Development (Swedish)
    17 August 2022
    0 references
    Achiziționarea unui tester Waver și Prober – dispozitive de testare pentru dezvoltarea cipurilor (Romanian)
    17 August 2022
    0 references
    Nakup Waver Tester in Prober – Testne naprave za razvoj čipov (Slovenian)
    17 August 2022
    0 references
    Zakup testera Waver i Prober – urządzenia testowe do rozwoju chipów (Polish)
    17 August 2022
    0 references
    Dornbirn
    0 references

    Identifiers

    AUST-1390
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