Acquisition of a microscope of high resolution and speed atomic forces (Q3184560): Difference between revisions
Jump to navigation
Jump to search
(Changed label, description and/or aliases in en: translated_label) |
(Changed an Item: Edited by the infer coords bot - inferring coordinates from location) |
||||||||||
| Property / coordinate location | |||||||||||
41°17'9.96"N, 1°58'56.71"E
| |||||||||||
| Property / coordinate location: 41°17'9.96"N, 1°58'56.71"E / rank | |||||||||||
Normal rank | |||||||||||
Revision as of 21:45, 9 October 2021
Project Q3184560 in Spain
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Acquisition of a microscope of high resolution and speed atomic forces |
Project Q3184560 in Spain |
Statements
171,490.0 Euro
0 references
342,980.0 Euro
0 references
50.0 percent
0 references
1 January 2018
0 references
31 December 2019
0 references
INSTITUTO DE CIENCIAS FOTONICAS
0 references
41°17'9.96"N, 1°58'56.71"E
0 references
08056
0 references
La presente actuación consiste en la adquisición de un microscopio de fuerzas atómicas (AFM) de alta resolución y velocidad. Este tipo de equipo es una herramienta fundamental para la caracterización de las estructuras y dispositivos fabricados en el laboratorio de nanofabricación y es un elemento clave para garantizar la competitividad del laboratorio y la calidad de la investigación realizada tanto en ICFO como en terceras instituciones del entorno que deseen utilizar el equipo. El equipo a adquirir reemplazará un AFM existente que adolece de importantes limitaciones y averías tanto en el scanner como en la electrónica de control y cuya reparación tendría un coste tan elevado que la única alternativa razonable es la adquisición de un equipo nuevo._x000D_ _x000D_ El equipo será instalado en el laboratorio de nanocaracterización, que está perfectamente acondicionado para este tipo de equipos y no requiere la realización de obra alguna. (Spanish)
0 references
This project is devoted to provisioning a new atomic force microscope (AFM) featuring high resolution and high speed for the nanocharacterization laboratory at ICFO. This kind of system is key for the characterization of devices and structures fabricated in the nanofabrication lab and is fundamental to guarantee the competitiveness of the lab and the quality of research. The tool will be available not only to ICFO users but also to third institutions from both academia and industry._x000D_ _x000D_ The system to be purchased will replace an existing AFM that suffers from severe limitations and has partial failuers both in its scanner and in the control electronics. The cost of its repair would be so high that the only reasonable alternative is the acquisition of a new system._x000D_ _x000D_ The system will be installed in the nanocharacterization lab, which is perfectly suited for this type of tool and process and does not require any construction work. (English)
0 references
Castelldefels
0 references
Identifiers
EQC2018-004079-P
0 references